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The article, “High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy,” demonstrates how to accomplish this feature by imaging a pinhole array at the sample position. This is not only useful for obtaining statistical information on the photophysics of the sample, but also, for homogeneous samples, the signal of all spots can be averaged to vastly boost the signal-to-noise ratio.
More information:
Martin Hörmann et al, High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy, Ultrafast Science (2023). DOI: 10.34133/ultrafastscience.0032
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Ultrafast Science
Citation:
High-sensitivity visualization of ultrafast carrier diffusion by wide-field holographic microscopy (2023, December 22)
retrieved 23 December 2023
from https://phys.org/news/2023-12-high-sensitivity-visualization-ultrafast-carrier-diffusion.html
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